X-ray microscopy and X-ray microanalysis : proceedings of the second international symposium (Stockholmn, 1960) / edited by A. Engström, V. Coslett, H. Pattee.

  • International Symposium on X-ray Optics and X-ray Microanalysis 1959 : Stockholm, Sweden)
Date:
1960
  • Books

About this work

Publication/Creation

Amsterdam ; London : Elsevier, 1960.

Physical description

x, 542 pages : illustrations ; 25 cm

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Notes

Text in English, French, or German.
Copy 1 Supplier/Donor: BMA

Type/Technique

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Where to find it

  • LocationStatusAccess
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    K3236

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