Micron : the international research and review journal for microscopy.

Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D.R. Beaman.

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Electron Probe Microanalysis

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Micron : the international research and review journal for microscopy.

Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D.R. Beaman.