Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D.R. Beaman.

Practical scanning electron microscopy : electron and ion microprobe analysis / edited by Joseph I. Goldstein and Harvey Yakowitz ; forward by T.E. Everhart.

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Microprobe analysis

Works from the collections

Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D.R. Beaman.

Practical scanning electron microscopy : electron and ion microprobe analysis / edited by Joseph I. Goldstein and Harvey Yakowitz ; forward by T.E. Everhart.